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Your search for Manufacturer: FEI
found:
  • 17 Listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Taichung, Taichung City
FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

202837
FEI  

FEI  

Tecnia F20S 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Singapore
FEI TECNAI F20S-TWIN TEM FIB 205:

FEI TECNAI F20S-TWIN TEM FIB 205

202853
FEI  

FEI  

FIB 200  

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Singapore
FEI, FIB, 200, TEM Sample Preparation:

FEI, FIB, 200, TEM Sample Preparation

in QRA Lab

 

202880
FEI  

FEI  

PHILIPS XL30S, SEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Singapore
FEI PHILIPS XL30S, SEM:

FEI PHILIPS XL30S, SEM

 

PHILIPS XL 30S FEG SEM & DX4I SYSTEM

202881
FEI  

FEI  

Sirion XL30 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Singapore
FEI, Sirion XL30, SEM:

FEI, Sirion XL30, SEM

SFEG Scanning Electron microscope with energy dispersive X-ray analys

In RQA Lab

202891
FEI  

FEI  

Sirion XL30 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Singapore
FEI, Sirion XL30, SEM:

FEI, Sirion XL30, SEM

202895
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Singapore
FEI, DA300, FIB, TEM Sample Preparation:

FEI, DA300, FIB, TEM Sample Preparation

 

In RQA Lab.  Unhooked

 

203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* East Fishkill, New York
FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 

203115
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Malta, New York
FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

Connected Idle.

 

203116
FEI  

FEI  

CLM + Dual Beam 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Malta, New York
FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

In Lab.  Idle

203117
FEI  

FEI  

ExSolve 2 WTP EFEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Malta, New York
FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:

FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB

In the fab.  Warm shutdown.

203118
FEI  

FEI  

TEM LINK 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Malta, New York
FEI, TEM Link:

FEI, TEM Link

203120
FEI  

FEI  

Technia G2 F20 TEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Malta, New York
FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM

,

203121
FEI  

FEI  

Tecnai G2 F20 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Malta, New York
FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM,

 

On line, operational

199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.