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Scanning Electron Microscopes
JEOL, JWS-7515, 200mm, SEM Offered 1 Offered at Best Price

JEOL, JWS-7515, 200mm, SEM



Upright Microscopes
NIKON LARGE SUBSTRATE INSPECTION MICROSOPE Offered 1 Offered at Best Price

NIKON LARGE SUBSTRATE INSPECTION MICROSOPE



Added  Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
Oct 20 201736
Applied Materials  

Applied Materials  

VeritySEM 5i 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   N* Albany, New York
Applied Materials, Verity SEM 5i, CD SEM, 300mm:
Applied Materials, Verity SEM 5i, CD SEM, 300mm

Installed.  Working


*  Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.