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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
111048
American Optical  

American Optical  

1177-1 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

2 195.00 F* Scotia, NY
AMERICAN OPTICAL FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source
1895
American Optical  

American Optical  

570 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 525.00 Scotia, NY
AMERICAN OPTICAL STEREO MICROSCOPE 7X - 42X:
Stereo Zoom Microscope

(stand not included)

 

1894
American Optical  

American Optical  

580 

List all items of this typeStereo Microscopes

in Optical Microscopes

2 550.00 Scotia, New York
AMERICAN OPTICAL STEREO ZOOM MICROSCOPES 10X - 60X:
Stereo Zoom Microscope

(stand and arm not included)

 

171583
Anatech Ltd  

Anatech Ltd  

Hummer 6.6T 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, New York
ANATECH HUMMER 6.6T SPUTTER SYSTEM:

Sputter System

180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

203103
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   N* East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

 

203104
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   N* East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

203105
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   N* East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

 

203106
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   N* East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

203107
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   N* East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
184614
ATM GmbH  

ATM GmbH  

Brillant BR250.2 

List all items of this typeCut-Off Saws

in Sample Preparation

1   F* Scotia, NY
ATM GmbH CUT OFF SAW 12" :
Cut-Off Saw
176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

1806
Bausch & Lomb  

Bausch & Lomb  

Nicholas Illuminator 

List all items of this typeIlluminators - Other

in Illuminators, Microscope

1   Scotia, New York
B&L NICHOLAS ILLUMINATOR:

Includes Lamp, Linkage, and Variable Transformer

AVAILABLE ONLY WITH THE PURCHASE OF A B&L STEREOZOOM MICROSCOPE

110163
BAL-TEC  

BAL-TEC  

SCD 050 

List all items of this typeSample Coaters

in Sample Preparation

1   Scotia, New York
BAL-TEC SAMPLE COATER/SPUTTER COATER SEM SAMPLE PREP:
Sputter Coater
1786
Bausch & Lomb  

Bausch & Lomb  

Type A 

List all items of this typeStands

in Parts and Accessories, Microscope

13 185.00 Scotia, NY
BAUSCH & LOMB 31-26-88 TYPE A INCIDENT LIGHT STAND:
Type A Incident Light Stand

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
1785
Bausch & Lomb  

Bausch & Lomb  

312690 

List all items of this typeParts and Accessories - Other

in Parts and Accessories, Microscope

10 180.00 F* Scotia, New York
BAUSCH & LOMB ER-ARM:
ER-Arm

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
964
Bausch & Lomb  

Bausch & Lomb  

MicroZoomII 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1 4,000.00 Scotia, NY
BAUSCH & LOMB MICROSCOPE WORK STATION:
Microscope Work Station

Long working distance objectives

 

146
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

7   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X:
Stereo Zoom Microscope

Scopes listed include pod and eyepieces only

 

248
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X:
Stereo Zoom Microscope with Camera
3264
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 1 

List all items of this typeStereo Microscopes

in Optical Microscopes

13 225.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 1X - 10X:
Stereo Zoom Microscope

Microscopes listed are for pod and eyepieces only

 

110365
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 2 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 350.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 2X:
Stereo Zoom Microscope

 



Microscopes listed are for pod and eyepieces only

 

145
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

7   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 7X - 30X:
Stereo Zoom Microscope

Pod color may vary
Microscopes listed are for pod and eyepieces only

 

1800
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 5 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 600.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 8X - 40X:
Stereo Zoom Microscope

Scopes listed include pod and eyepieces only

 

159266
Bausch & Lomb  

Bausch & Lomb  

SZ4 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
Bausch & Lomb Stereo Zoom 4:
StereoZoom 4 Microscope with Boom Stand
161016
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Plano, TX
Bausch & Lomb StereoZoom 4:
Microscope on Small Base
161018
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 6 Plus 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
Bausch & Lomb StereoZoom 6 Plus:
Microscope Head
159267
Bausch & Lomb  

Bausch & Lomb  

SZ 6-ST 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Plano, TX
Bausch & Lomb StereoZoom 6-ST:
StereoZoom Microscope with Boom Stand
157435
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
BAUSCH & LOMB StereoZoom 7:
Microscope & Boom Stand
110364
Bausch & Lomb  

Bausch & Lomb  

Type K 

List all items of this typeStands

in Parts and Accessories, Microscope

1 235.00 Scotia, NY
BAUSCH & LOMB TYPE K STAND:
K Stand for B&L StereoZoom Microscopes

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
E-Arm not included
109598
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

4 300.00 Scotia, NY
BOOM STAND:
Table Clamp Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109648
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

1 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109553
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109554
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109122
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

19 350.00 F* Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109425
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

6 350.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand w/ Rectangular Horizontal Post

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109427
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
BOOM STAND:
Dual Arm Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109549
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand w/ Rotatable Knuckle

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
185800
Buehler  

Buehler  

SimpliMet 1000 

List all items of this typeMounting Press

in Sample Preparation

1 4,950.00 F* Scotia, NY
BUEHLER AUTOMATIC MOUNTING PRESS 1" TO 2" CAPACITY:
Automatic Mounting Press
23007
Buehler  

Buehler  

Carbimet Paper Discs 

List all items of this typeSample Preparation - Other

in Sample Preparation

2 50.00 F* Scotia, NY
BUEHLER CARBIMET 320 GRIT PAPER DISCS:
Paper Discs 320 Grit

Buehler part number: 30-5108-320-100
4436
Buehler  

Buehler  

Consumables 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

4   Scotia, NY
BUEHLER CONSUMABLES, POLISHING AND GRINDING:
Polishing and Grinding Consumables
122523
Buehler  

Buehler  

Dressing Chuck 

List all items of this typeCut-Off Saws

in Sample Preparation

2 185.00 F* Scotia, NY
BUEHLER ISOMET DRESSING CHUCK:
Dressing Chuck

142877
Buehler  

Buehler  

ISOMET 

List all items of this typeCut-Off Saws

in Sample Preparation

4 3,350.00 F* Scotia, New York
BUEHLER LOW SPEED CUT-OFF SAW:
Precision Sectioning Saw

Representative photo - color of saw may vary

Various ISOMET chucks available. 
See other information for more details.
116574
Buehler  

Buehler  

Primet 

List all items of this typeSample Preparation - Other

in Sample Preparation

1 650.00 F* Scotia, NY
BUEHLER PRIMET MODULAR DISPENSING SATELLITE:
Modular Dispensing Satellite

147703
Buehler  

Buehler  

48-1573GGG-R 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1 3,850.00 F* Scotia, NY
BUEHLER THREE POSITION POLISHING BENCH :
Three Position Polishing Bench

7353
CPS  

CPS  

6004/1958 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1 3,750.00 Scotia, NY
CPS ELECTRON GUN POWER SUPPLY 30KV:
Electron Gun Power Supply

CPS Computer Power Supply 6004
28680
Dage-MTI  

Dage-MTI  

SERIES 68 

List all items of this typeCameras and Controllers

in Optical Microscopes

2 1,200.00 Scotia, NY
DAGE-MTI SERIES 68 INFRARED CAMERA:
Infrared Camera
194899
DELTRONIC  

DELTRONIC  

DH14-RR 

List all items of this typeMeasuring Microscopes

in Optical Microscopes

1   Plano, Texas
Deltronic DH14-RR Profile Projector :
Deltronic DH14-RR Profile Projector 
  • 20X Objective Lens
194900
Denton  

Denton  

Desk II 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Plano, Texas
Denton Desk II SEM Sample Coater:
Denton Desk II SEM Sample Coater
  • 5.375" (dia.) X 9" (h) Chamber
  • Carbon Rod Accessory
57426
Denton  

Denton  

DESK II 

List all items of this typeSample Coaters

in Sample Preparation

1 6,250.00 F* Scotia, New York
DENTON VACUUM SPUTTER /SAMPLE COATER SEM SAMPLE PREP :
Metal Sputter

159268
Diagnostic Instrumts  

Diagnostic Instrumts  

 

List all items of this typeStereo Microscopes

in Optical Microscopes

2   Plano, TX
Diagnostic Instruments:
Microscope Boom Stand
86452
Diagnostic Instrumts  

Diagnostic Instrumts  

SMS16-B 

List all items of this typeStands

in Parts and Accessories, Microscope

1 325.00 F* Scotia, NY
DIAGNOSTIC INSTRUMENTS BOOM STAND:
Boom Stand
109548
Diagnostic Instrumts  

Diagnostic Instrumts  

SMS16-A 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
DIAGNOSTIC INSTRUMENTS BOOM STAND:
Weighted Base Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes

Available only with purchase of a Stereozoom Microscope
E-arm not included

43778
Diagnostic In  

Diagnostic In  

SMS20 

List all items of this typeStands

in Parts and Accessories, Microscope

1 1,075.00 F* Scotia, NY
DIAGNOSTIC INSTRUMENTS SMS20:
Boom Stand

Stands can be fitted for B&L Stereo Zoom Microscopes, Leica Stereozoom Microscopes and Nikon Stereo Zoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
18711
Dolan Jenner  

Dolan Jenner  

180 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 150.00 F* Scotia, NY
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source
122729
Dolan Jenner  

Dolan Jenner  

PL-750A- 111 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 225.00 F* Scotia, NY
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source

4499
Edwards  

Edwards  

S150 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, New York
EDWARDS CARBON EVAPORATION SOURCE:
Carbon Evaporation Source
202880
FEI  

FEI  

PHILIPS XL30S, SEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Singapore
FEI PHILIPS XL30S, SEM:

FEI PHILIPS XL30S, SEM

 

PHILIPS XL 30S FEG SEM & DX4I SYSTEM

202837
FEI  

FEI  

Tecnia F20S 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Singapore
FEI TECNAI F20S-TWIN TEM FIB 205:

FEI TECNAI F20S-TWIN TEM FIB 205

203116
FEI  

FEI  

CLM + Dual Beam 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Malta, New York
FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

In Lab.  Idle

202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

203115
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Malta, New York
FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

Connected Idle.

 

195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Taichung, Taichung City
FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


202895
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Singapore
FEI, DA300, FIB, TEM Sample Preparation:

FEI, DA300, FIB, TEM Sample Preparation

 

In RQA Lab.  Unhooked

 

202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* East Fishkill, New York
FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 

199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


203117
FEI  

FEI  

ExSolve 2 WTP EFEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Malta, New York
FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:

FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB

In the fab.  Warm shutdown.

202853
FEI  

FEI  

FIB 200  

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Singapore
FEI, FIB, 200, TEM Sample Preparation:

FEI, FIB, 200, TEM Sample Preparation

in QRA Lab

 

202881
FEI  

FEI  

Sirion XL30 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Singapore
FEI, Sirion XL30, SEM:

FEI, Sirion XL30, SEM

SFEG Scanning Electron microscope with energy dispersive X-ray analys

In RQA Lab

202891
FEI  

FEI  

Sirion XL30 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Singapore
FEI, Sirion XL30, SEM:

FEI, Sirion XL30, SEM

203118
FEI  

FEI  

TEM LINK 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Malta, New York
FEI, TEM Link:

FEI, TEM Link

203120
FEI  

FEI  

Technia G2 F20 TEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Malta, New York
FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM

,

203121
FEI  

FEI  

Tecnai G2 F20 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   N* Malta, New York
FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM,

 

On line, operational

134541
FIBER OPTIC LIGHT SOURCE 
FIBER OPTIC LIGHT SOURCE 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 180.00 F* Scotia, New York
FIBER OPTIC LIGHT SOURCE:
Remote Fiber Optic Illuminator

Model FOI-150-Remote
134624
FIBER OPTIC LIGHT SOURCE 
FIBER OPTIC LIGHT SOURCE 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 180.00 F* Scotia, New York
FIBER OPTIC LIGHT SOURCE:
Fiber Optic Illuminator

Manufacturer Unknown
176740
Gatan  

Gatan  

691 PIPS 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Scotia, New York
GATAN 691 PRECISION ION POLISHING SYSTEM PIPS:

Precision Ion Polishing System (PIPS).

Includes Gatan Binocular Microscope

The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

175315
Gatan  

Gatan  

681 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, New York
GATAN ION BEAM COATER (IBC):
Ion Beam Coater

Ion Beam Coater (IBC) designed to produce high-quality conductive coatings on

SEM or TEM specimens
202146
Hitachi  

Hitachi  

HF-2000 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging:

Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging

200KeV Advanced Analytical TEM  

1995 Vintage

S/N : 6214-3

Un-hooked in lab.

100557
Hitachi  

Hitachi  

S-2400 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Scotia, NY
HITACHI S-2400 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Micrscope (SEM)
60831
Hitachi  

Hitachi  

S-4100 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Scotia, NY
HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE:
Field Emission Electron Microscope

NB: System is missing Ion pump power supply. Sold "As Is".
35762
Hitachi  

Hitachi  

S-7000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* Plano, TX
Hitachi S-7000:
CD SEM Measurement Tool
324
Hitachi  

Hitachi  

S-806C 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Scotia, NY
HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE:
Field Emission Scanning Electron Microscope
202854
Hitachi  

Hitachi  

S-8820 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   N* Santa Clara, California
Hitachi, 8820, CD SEM, 200mm:

Hitachi, 8820, CD SEM, 200mm

Still in the Fab

 

187651
Hitachi  

Hitachi  

8820 CD SEM 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   Singapore
Hitachi, 8820, CD SEM, 200mm:

Hitachi, 8820, CD SEM, 200mm

Still in the fab,  NOTE  MOVE OUT 2017 Q3. 

S/N: 9109-038820

178288
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   Taichung, Taichung City
Hitachi, CD-SEM, 300mm:

Manufactured in 2007; Status: Bagged and Skidded

178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Singapore
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


195362
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* Singapore
Hitachi, S-9380, CD SEM, 300mm:
Hitachi, S-9380, CD SEM, 300mm

Tool is Bagged & Skidded in Warehouse

S/N : 2146-01
197918
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:
Hitachi, S-9380II, CD-SEM, 300mm

!!! Multiple Units Available!!!  Please Inquire
178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
201150
Hitachi  

Hitachi  

CG5000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   Dresden, Saxony
Hitachi. CG5000, 300mm CD SEM:
Hitachi. CG5000, 300mm CD SEM

S/N : 61C3-01
199709
HSEB  

HSEB  

Axiospect300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Dresden, Saxony
HSEB, Axiospect 300, Optical Microscope, 300mm:
HSEB, Axiospect 300, Optical Microscope, 300mm
199710
HSEB  

HSEB  

Axiospect300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Dresden, Saxony
HSEB, Axiospect 300, Optical Microscope, 300mm:

HSEB, Axiospect 300, Optical Microscope, 300mm
Cold Offline

!!! Multiple Units Available !!! Please inquire.

202816
HSEB  

HSEB  

Axiospect 301 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   N* Malta, New York
HSEB, Axiospect 301, Optical Microscope, 300mm:

HSEB, Axiospect 301, Optical Microscope, 300mm

202817
HSEB  

HSEB  

Axiospect 301 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   N* Malta, New York
HSEB, Axiospect 301, Optical Microscope, 300mm:

HSEB, Axiospect 301, Optical Microscope, 300mm

194902
Irvine Optical Co.  

Irvine Optical Co.  

Ultrastation 3.E 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Plano, Texas
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope:
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
  • For up to 20omm Wafers
  • Nikon CF Optical System
  • 5X, 10X, 20X & 50X Objective Lenses
  • 10X WF Eyepieces
  • 12V 100W Halogen Lamp
6402
JEOL  

JEOL  

JSM 6100 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Scotia, NY
JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Microscope with LaB Filament
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