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Electron Microscopes


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List all 2 product types under Electron MicroscopesList all 2 product types under Electron Microscopes


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
201736
Applied Materials  

Applied Materials  

VeritySEM 5i 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   Albany, New York
Applied Materials, Verity SEM 5i, CD SEM, 300mm:

Applied Materials, Verity SEM 5i, CD SEM, 300mm

Installed.  Working

7353
CPS  

CPS  

6004/1958 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1 3,750.00 Scotia, NY
CPS ELECTRON GUN POWER SUPPLY 30KV:
Electron Gun Power Supply

CPS Computer Power Supply 6004
199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


100557
Hitachi  

Hitachi  

S-2400 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Scotia, NY
HITACHI S-2400 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Micrscope (SEM)
60831
Hitachi  

Hitachi  

S-4100 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Scotia, NY
HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE:
Field Emission Electron Microscope

NB: System is missing Ion pump power supply. Sold "As Is".
35762
Hitachi  

Hitachi  

S-7000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* Plano, TX
Hitachi S-7000:
CD SEM Measurement Tool
324
Hitachi  

Hitachi  

S-806C 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Scotia, NY
HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE:
Field Emission Scanning Electron Microscope
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Singapore
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


195362
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* Singapore
Hitachi, S-9380, CD SEM, 300mm:
Hitachi, S-9380, CD SEM, 300mm

Tool is Bagged & Skidded in Warehouse

S/N : 2146-01
197918
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:
Hitachi, S-9380II, CD-SEM, 300mm

!!! Multiple Units Available!!!  Please Inquire
201533
Hitachi  

Hitachi  

S-9380 II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

Completely Refurbished 

S/N : 2145-06

201534
Hitachi  

Hitachi  

S-9380 II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

S/N : 2160-02

Completely Refurbished

178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
201150
Hitachi  

Hitachi  

CG5000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   Dresden, Saxony
Hitachi. CG5000, 300mm CD SEM:
Hitachi. CG5000, 300mm CD SEM

S/N : 61C3-01
6402
JEOL  

JEOL  

JSM 6100 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Scotia, NY
JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Microscope with LaB Filament
77955
JEOL  

JEOL  

JWS-7505ZH 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* Plano, TX
Jeol JWS-7505ZH:
Critical Dimension Scanning Electron Microscope
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Singapore
JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Singapore
JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Singapore
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded


!!! MULTIPLE UNITS AVAILABLE!!! Please inquire
81042
Microspec  

Microspec  

WDX-2A(Spectrometer) 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Scotia, NY
MICROSPEC WDX-2A SPECTROMETER:
Spectrometer
201129
Applied Materials  

Applied Materials  

SemvisionG3 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Dresden, Saxony
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

S/N : W-5002

201155
Applied Materials In  

Applied Materials In  

SEMVision G3 Lite 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Dresden, Saxony
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

S/N : W-3002

Warm idle, in the Fab.

199706
Zeiss  

Zeiss  

Ultra 55, LEO Gemini 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Dresden, Saxony
Zeiss, Ultra 55, LEO Gemini, 300mm, SEM:
Zeiss, Ultra 55, LEO Gemini, 300mm, SEM



*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Electron Microscopes:
Applied Materials Inc., Applied Materials, Inc., CPS, FEI, Hitachi, JEOL, KLA-Tencor, Microspec, Zeiss