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Scanning Electron Microscopes


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Item IDItem DescriptionResolution ÅMagnificationGun TypeVacuum SystemPower Requirements#PriceNotes Location
MakeModelVoltageAmps
(Å)(kX)(V)(A)$
195983 Applied Materials Elite MS MC 1 Dresden, Saxony
201129 Applied Materials SemvisionG3 1 Dresden, Saxony
201155 Applied Materials In SEMVision G3 Lite 1 Dresden, Saxony
7353 CPS 6004/19581150.5 1 3,750.00 Scotia, NY
199704 FEI EXPIDA 1 F* Dresden, Saxony
178294 Hitachi AS5000 1 F* Singapore
178296 Hitachi Microanalysis System 1 F* Taichung, Taichung City
100557 Hitachi S-240040.00300TungstenDiffusion Pumpd24020.0 1 F* Scotia, NY
60831 Hitachi S-410015.00300Field EmissionDiffusion Pumpd110 1 F* Scotia, NY
192497 Hitachi S-5500 1 F* Malta, New York
324 Hitachi S-806C60.00100Field EmissionTurbo Pumped11530.0 1 F* Scotia, NY
178299 Hitachi Z-5700 1 F* Taichung, Taichung City
178300 JEOL 7555 1 Taichung, Taichung City
178302 JEOL JEM-2500SE 1 Taichung, Taichung City
178303 JEOL JEM-2500SE 1 Taichung, Taichung City
6402 JEOL JSM 610040.00300Tungsten&Lab 6Diffusion Pumpd 1 F* Scotia, NY
187765 JEOL JWS 7555S 1 F* Singapore
189689 JEOL JWS-7515 1 F* Singapore
178304 KLA-Tencor ES31 1 F* Singapore
178305 KLA-Tencor ES32 1 Taichung, Taichung City
81042 Microspec WDX-2A(Spectrometer) 1 Scotia, NY
199706 Zeiss Ultra 55, LEO Gemini 1 F* Dresden, Saxony

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Scanning Electron Microscopes:
Applied Materials Inc., Applied Materials, Inc., CPS, FEI, Hitachi, JEOL, KLA-Tencor, Microspec, Zeiss