 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
 |
77955
|
JEOL
|
JEOL |
JWS-7505ZH |
in Electron Microscopes
|
1
|
|
|
F* |
Plano, TX |
|
Jeol JWS-7505ZH:Critical Dimension Scanning Electron Microscope
|
 |
6402
|
JEOL
|
JEOL |
JSM 6100 |
in Electron Microscopes
|
1
|
|
|
F* |
Scotia, NY |
|
JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE:Scanning Electron Microscope with LaB Filament
|
 |
178300
|
JEOL
|
JEOL |
7555 |
in Electron Microscopes
|
1
|
|
|
|
Taichung, Taichung City |
|
JEOL, Defect Review, 200mm:Status: Bagged & Skidded in warehouse Parts tool. Listed as major parts missing.
|
 |
178302
|
JEOL
|
JEOL |
JEM-2500SE |
in Electron Microscopes
|
1
|
|
|
|
Taichung, Taichung City |
|
JEOL, JEM-2500SE Microscopes, 300mm:Status: Bagged and Skidded
|
 |
178303
|
JEOL
|
JEOL |
JEM-2500SE |
in Electron Microscopes
|
1
|
|
|
|
Taichung, Taichung City |
|
JEOL, JEM-2500SE Microscopes, 300mm:Status: Bagged and Skidded
|
 |
187765
|
JEOL
|
JEOL |
JWS 7555S |
in Electron Microscopes
|
1
|
|
|
F* |
Singapore, |
|
JEOL, JWS 7555S, Defect Review, 200mm:JEOL, JWS 7555S, Defect Review, 200mm
|
 |
189689
|
JEOL
|
JEOL |
JWS-7515 |
in Electron Microscopes
|
1
|
|
|
F* |
Singapore, |
|
JEOL, JWS-7515, 200mm, SEM:JEOL, JWS-7515, 200mm, SEM S/N: WS179028-108
|
|
 |