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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
178291
AMAT  

AMAT  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Taichung, Taichung City
Applied Materials, SEMVision G3, DR-SEM, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
111048
American Optical  

American Optical  

1177-1 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

2 195.00 F* Scotia, NY
AMERICAN OPTICAL FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source
1895
American Optical  

American Optical  

570 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 525.00 Scotia, NY
AMERICAN OPTICAL STEREO MICROSCOPE 7X - 42X:
Stereo Zoom Microscope

(stand not included)

 

1894
American Optical  

American Optical  

580 

List all items of this typeStereo Microscopes

in Optical Microscopes

2 550.00 Scotia, NY
AMERICAN OPTICAL STEREO ZOOM MICROSCOPES 10X - 60X:
Stereo Zoom Microscope

(stand and arm not included)

171583
Anatech Ltd  

Anatech Ltd  

Hummer 6.6T 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, NY
ANATECH HUMMER 6.6T SPUTTER SYSTEM:
Sputter System
195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

189511
Applied Materials  

Applied Materials  

Semvision CX 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* Burlington, Vermont
Applied Materials, SEMVision CX, 200mm, :
Applied Materials, SEMVision CX, 200mm,

Serial Number is W854.
192342
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Taichung, Taichung City
SEMVision G3, Applied Materials, 300mm, Defect Review System:
SEMVision G3, Applied Materials, 300mm, Defect Review System

Known Parts Missing:
qty. 1 MINIMODULE DENKA,TFE ( TIP)



S/N: W-3009

DOM : 5/1/2007
180207
Applied Materials In  

Applied Materials In  

Semvision G3 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Taichung, Taichung City
Applied Materials Semvision G3 300mm :
Applied Materials Semvision G3 300mm
184614
ATM GmbH  

ATM GmbH  

Brillant BR250.2 

List all items of this typeCut-Off Saws

in Sample Preparation

1   F* Scotia, NY
ATM GmbH CUT OFF SAW 12" :
Cut-Off Saw
110163
BAL-TEC  

BAL-TEC  

SCD 050 

List all items of this typeSample Coaters

in Sample Preparation

1   Scotia, New York
BAL-TEC SAMPLE COATER/SPUTTER COATER SEM SAMPLE PREP:
Sputter Coater
1785
Bausch & Lomb  

Bausch & Lomb  

312690 

List all items of this typeParts and Accessories - Other

in Parts and Accessories, Microscope

10 180.00 F* Scotia, NY
BAUSCH & LOMB ER-ARM:
ER-Arm

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
964
Bausch & Lomb  

Bausch & Lomb  

MicroZoomII 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1 4,000.00 Scotia, NY
BAUSCH & LOMB MICROSCOPE WORK STATION:
Microscope Work Station

Long working distance objectives

 

3264
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 1 

List all items of this typeStereo Microscopes

in Optical Microscopes

13 225.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 1X - 10X:
Stereo Zoom Microscope

Microscopes listed are for pod and eyepieces only

 

110365
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 2 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 350.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 2X:
Stereo Zoom Microscope

 



Microscopes listed are for pod and eyepieces only

 

145
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

7   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 7X - 30X:
Stereo Zoom Microscope

Pod color may vary
Microscopes listed are for pod and eyepieces only

 

161016
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Plano, TX
Bausch & Lomb StereoZoom 4:
Microscope on Small Base
1800
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 5 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 600.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 8X - 40X:
Stereo Zoom Microscope

Scopes listed include pod and eyepieces only

 

161018
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 6 Plus 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
Bausch & Lomb StereoZoom 6 Plus:
Microscope Head
157435
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
BAUSCH & LOMB StereoZoom 7:
Microscope & Boom Stand
146
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

7   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X:
Stereo Zoom Microscope

Scopes listed include pod and eyepieces only

 

248
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X:
Stereo Zoom Microscope with Camera
159267
Bausch & Lomb  

Bausch & Lomb  

SZ 6-ST 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Plano, TX
Bausch & Lomb StereoZoom 6-ST:
StereoZoom Microscope with Boom Stand
159266
Bausch & Lomb  

Bausch & Lomb  

SZ4 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
Bausch & Lomb Stereo Zoom 4:
StereoZoom 4 Microscope with Boom Stand
1786
Bausch & Lomb  

Bausch & Lomb  

Type A 

List all items of this typeStands

in Parts and Accessories, Microscope

13 185.00 Scotia, NY
BAUSCH & LOMB 31-26-88 TYPE A INCIDENT LIGHT STAND:
Type A Incident Light Stand

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
110364
Bausch & Lomb  

Bausch & Lomb  

Type K 

List all items of this typeStands

in Parts and Accessories, Microscope

1 235.00 Scotia, NY
BAUSCH & LOMB TYPE K STAND:
K Stand for B&L StereoZoom Microscopes

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
E-Arm not included
109427
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
BOOM STAND:
Dual Arm Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109553
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109554
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109648
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

1 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109425
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

6 350.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand w/ Rectangular Horizontal Post

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109122
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

19 350.00 F* Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109549
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand w/ Rotatable Knuckle

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109598
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

4 300.00 Scotia, NY
BOOM STAND:
Table Clamp Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
147703
Buehler  

Buehler  

48-1573GGG-R 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1 3,850.00 F* Scotia, NY
BUEHLER THREE POSITION POLISHING BENCH :
Three Position Polishing Bench

23007
Buehler  

Buehler  

Carbimet Paper Discs 

List all items of this typeSample Preparation - Other

in Sample Preparation

2 50.00 F* Scotia, NY
BUEHLER CARBIMET 320 GRIT PAPER DISCS:
Paper Discs 320 Grit

Buehler part number: 30-5108-320-100
4436
Buehler  

Buehler  

Consumables 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

4   Scotia, NY
BUEHLER CONSUMABLES, POLISHING AND GRINDING:
Polishing and Grinding Consumables
122523
Buehler  

Buehler  

Dressing Chuck 

List all items of this typeCut-Off Saws

in Sample Preparation

2 185.00 F* Scotia, NY
BUEHLER ISOMET DRESSING CHUCK:
Dressing Chuck

178407
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Polisher, Ecomet-3000 300mm:
Status: Bagged and Skidded
178409
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Polisher, 300mm:
Status: Bagged and Skidded
178410
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Ecomet-3000 Polisher, 300mm:
Status: Bagged and Skidded
142877
Buehler  

Buehler  

ISOMET 

List all items of this typeCut-Off Saws

in Sample Preparation

4 3,350.00 F* Scotia, New York
BUEHLER LOW SPEED CUT-OFF SAW:
Precision Sectioning Saw

Representative photo - color of saw may vary

Various ISOMET chucks available. 
See other information for more details.
116574
Buehler  

Buehler  

Primet 

List all items of this typeSample Preparation - Other

in Sample Preparation

1 650.00 F* Scotia, NY
BUEHLER PRIMET MODULAR DISPENSING SATELLITE:
Modular Dispensing Satellite

185800
Buehler  

Buehler  

SimpliMet 1000 

List all items of this typeMounting Press

in Sample Preparation

1 4,950.00 F* Scotia, NY
BUEHLER AUTOMATIC MOUNTING PRESS 1" TO 2" CAPACITY:
Automatic Mounting Press
173380
Coborn  

Coborn  

PS1 (PS-1) 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Leominster, Massachusetts
Coborn Planetary Skive Bench for Diamond Faceting & Polishing:

Coborn Planetary Skive (Scaif) Bench for Faceting and Polishing single-crystal diamond (SCD).  Equipped with 24x36 inch table, 3-phase fixed speed spindle, and an additional planetary motion functionality.

  • Engineered to polish and/or finish single-crystal diamond (SCD) materials including cutting tools, gemstones, and substrates for scientific research.
  • Planetary motion can improve diamond removal rates, polished surface finish, and/or edge quality especially on difficult-to-polish SCD (CVD, HPHT, or Natural).  The relative motion of the wheel and SCD workpiece also minimizes uneven wear of "tracks" in the ferrous skive wheel/plate.
  • The system design offered can be operated with or without planetary motion.
  • Refurbishment includes a new charcoal gray laminated top applied to a thick steel tabletop. 
  • Goods to be sold in tested, refurbished condition with a limited warranty to ensure functionality. 
  • PHOTO NOTE: The unit shown in the attached images has been sold.  However, refurbishment of a similar Coborn unit is nearing completion as of 10/31/2017.  Photos of actual unit offered can be provide prior to sale.
165713
Coborn  

Coborn  

SK-KKAS  

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Sterling, Massachusetts
Coborn SK-KKAS Skive Spindle (1.5kW):
  • Coborn SK-KKAS Scaif (Skive) Spindle with advanced functionality.
  • For Polishing & Faceting Single Crystal Diamond: Natural and Lab-Made
    • Height-Adjustable Nose (Z position of spindle nose).
    • Includes Coborn Airflow Bowl option (for dust collection below spindle).
    • Includes Coborn Expanding Nose option (replaceable "collet").
    • Wired to enable variable spindle speed.
  • This 3-Phase spindle was previously tested at Cline Innovations using a sturdy skive bench (not included/available) equipped with a variable speed drive.
  • Skive bench is NOT included with this listing.
  • If you prefer to purchase a complete, operational planetary scaife bench, please see Cline Innovations' listing 173380 .
7353
CPS  

CPS  

6004/1958 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1 3,750.00 Scotia, NY
CPS ELECTRON GUN POWER SUPPLY 30KV:
Electron Gun Power Supply

CPS Computer Power Supply 6004
28680
Dage-MTI  

Dage-MTI  

SERIES 68 

List all items of this typeCameras and Controllers

in Optical Microscopes

2 1,200.00 Scotia, NY
DAGE-MTI SERIES 68 INFRARED CAMERA:
Infrared Camera
194899
DELTRONIC  

DELTRONIC  

DH14-RR 

List all items of this typeMeasuring Microscopes

in Optical Microscopes

1   Plano, Texas
Deltronic DH14-RR Profile Projector :
Deltronic DH14-RR Profile Projector 
  • 20X Objective Lens
194900
Denton  

Denton  

Desk II 

List all items of this typeSample Coaters

in Sample Preparation

1   Plano, Texas
Denton Desk II SEM Sample Coater:
Denton Desk II SEM Sample Coater
  • 5.375" (dia.) X 9" (h) Chamber
  • Carbon Rod Accessory
57426
Denton  

Denton  

DESK II 

List all items of this typeSample Coaters

in Sample Preparation

1 6,250.00 F* Scotia, New York
DENTON VACUUM SPUTTER /SAMPLE COATER SEM SAMPLE PREP :
Metal Sputter

43778
Diagnostic In  

Diagnostic In  

SMS20 

List all items of this typeStands

in Parts and Accessories, Microscope

1 1,075.00 F* Scotia, NY
DIAGNOSTIC INSTRUMENTS SMS20:
Boom Stand

Stands can be fitted for B&L Stereo Zoom Microscopes, Leica Stereozoom Microscopes and Nikon Stereo Zoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
159268
Diagnostic Instrumts  

Diagnostic Instrumts  

 

List all items of this typeStereo Microscopes

in Optical Microscopes

2   Plano, TX
Diagnostic Instruments:
Microscope Boom Stand
109548
Diagnostic Instrumts  

Diagnostic Instrumts  

SMS16-A 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
DIAGNOSTIC INSTRUMENTS BOOM STAND:
Weighted Base Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes

Available only with purchase of a Stereozoom Microscope
E-arm not included

86452
Diagnostic Instrumts  

Diagnostic Instrumts  

SMS16-B 

List all items of this typeStands

in Parts and Accessories, Microscope

1 325.00 F* Scotia, NY
DIAGNOSTIC INSTRUMENTS BOOM STAND:
Boom Stand
18711
Dolan Jenner  

Dolan Jenner  

180 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 150.00 F* Scotia, NY
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source
122729
Dolan Jenner  

Dolan Jenner  

PL-750A- 111 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 225.00 F* Scotia, NY
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source

4499
Edwards  

Edwards  

S150 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, New York
EDWARDS CARBON EVAPORATION SOURCE:
Carbon Evaporation Source
195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Taichung, Taichung City
FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


191756
FEI  

FEI  

Tecnia G2 30 S-TWIN 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   F* East Fishkill, New York
FEI Tecnia G2 30 S-TWIN, TEM, 300KeV with LaB6 filament :
FEI Tecnia G2 30 S-TWIN: 300KeV LaB6 transmission electron microscope, volume imaging tool for semiconductor applications.  Also, can be used for biological samples.


Configuration :
  • CompuStage Single-tilt Holder   1ea. 
  • CompuStage Low-background Double-tilt Holder  2ea.
  • Gatan US1000 P (2k x 2k) Digital Camera on the microscope
  • Alignments for 300Kev and 200KeV but no alignments for 120KeV
  • Magnification Calibration Package  
  • Support PC
  • TEM Scripting  
  • LaB6 emitter (Denka / Mitsui)  
  • TMP and TMP Vacuum Software  





Cold idle in Lab.

2010 

S/N: 30TN6S / D906


FP 5032/20            Tecnai G2 30 S-TWIN

The Tecnai G2 30 S-TWIN is a 300 kV Transmission Electron Microscope. It is a high-resolution microscope, optimized for complete material characterization by combining analytical and imaging capabilities, and optimized tilt performance with ease of operation in all modes (TEM / STEM and analytical modes).

 

The Tecnai G2 TEM’s are equipped with the most advanced operating system currently available in the market of TEM systems, i.e. the Windows XP operating system. In the unique Tecnai concept, all microscope components, like the electron gun, the optical elements, the vacuum system and the stage, are completely digitally controlled. The task-oriented user interface allows users to automatically recall all optimized operating conditions including lens settings, gun parameters, optical alignments, aperture alignments (optional) for all the different techniques such as TEM, STEM, CBED, Diffraction and Analysis. Likewise, all detectors, such as CCD cameras, STEM detectors, EDS detectors and EELS detectors are computer controlled. Data acquisition, using these detectors, is embedded in the Tecnai G2 user interface and can be automated for acquisition processes, like tomography and spectrum imaging. Because of this sophisticated computer system, Tecnai G2 is especially suited for multi-user and multi-discipline environments.

In addition, the Tecnai G2 systems are equipped with the industry standard, reliable and fast FireWire data transfer technology. The system can be equipped with a single or dual monitor set-up depending on the number of detectors on the system.

Tecnai G2 can easily be connected to a network for exporting data and is ready for remote operation capabilities allowing for operation from an adjacent room and remote viewing during data acquisition.



134624
FIBER OPTIC LIGHT SOURCE 
FIBER OPTIC LIGHT SOURCE 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 180.00 F* Scotia, NY
FIBER OPTIC LIGHT SOURCE:
Fiber Optic Illuminator

Manufacturer Unknown
134541
FIBER OPTIC LIGHT SOURCE 
FIBER OPTIC LIGHT SOURCE 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 180.00 F* Scotia, NY
FIBER OPTIC LIGHT SOURCE:
Remote Fiber Optic Illuminator

Model FOI-150-Remote
18713
Fostec  

Fostec  

8300 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

20 175.00 F* Scotia, NY
LEEDS FOSTEC FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source

Representative photo

These units are manufactured by Fostec and re-branded by different companies.
The light source received may not be branded Fostec.

175315
Gatan  

Gatan  

681 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, NY
GATAN ION BEAM COATER (IBC):
Ion Beam Coater

Ion Beam Coater (IBC) designed to produce high-quality conductive coatings on

SEM or TEM specimens
175864
Gatan  

Gatan  

691 PIPS 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Scotia, New York
GATAN 691 PRECISION ION POLISHING SYSTEM PIPS:

Precision Ion Polishing System (PIPS)

The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

176740
Gatan  

Gatan  

691 PIPS 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Scotia, New York
GATAN 691 PRECISION ION POLISHING SYSTEM PIPS:

Precision Ion Polishing System (PIPS).

Includes Gatan Binocular Microscope

The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

178293
Hitachi  

Hitachi  

4500 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Singapore,
Hitachi, 4500 SEM, 200mm:
Manufactured in 1990
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Singapore,
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178297
Hitachi  

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Taichung, Taichung City
Hitachi, RS4000 , Defect Review, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
178710
Hitachi  

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Taichung, Taichung City
100557
Hitachi  

Hitachi  

S-2400 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Scotia, NY
HITACHI S-2400 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Micrscope (SEM)
60831
Hitachi  

Hitachi  

S-4100 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Scotia, NY
HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE:
Field Emission Electron Microscope

NB: System is missing Ion pump power supply. Sold "As Is".
191596
Hitachi  

Hitachi  

S-4500 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Burlington, Vermont
Hitachi, S-4500, SEM, Failure Analysis SEM:
Hitachi, S-4500, SEM, Failure Analysis SEM
Quartz PCI USB V9.5 (for Image Capture)
System is powered up and under vacuum.
Was under service contract through April 2017.


S/N: 7926-02


191493
Hitachi  

Hitachi  

S-5000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Burlington, Vermont
Hitachi, S-5000, SEM, 200mm:
Hitachi, S-5000, SEM, 200mm

Running.
Power ON, Under Vacuum.

S/N: 0500-02-03

DOM 1995
192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


35762
Hitachi  

Hitachi  

S-7000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* Plano, TX
Hitachi S-7000:
CD SEM Measurement Tool
178287
Hitachi  

Hitachi  

S-7800 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* Singapore,
Hitachi, S-7800 CD-SEM, 200mm:
Manufactured in 2008
324
Hitachi  

Hitachi  

S-806C 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Scotia, NY
HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE:
Field Emission Scanning Electron Microscope
195362
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* Singapore,
Hitachi, S-9380, CD SEM, 300mm:
Hitachi, S-9380, CD SEM, 300mm

Tool is Bagged & Skidded in Warehouse

S/N : 2146-01
178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
181188
HSEB  

HSEB  

Axiospect 300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Dresden, Saxony
HSEB Axiospect 300, 300mm Wafer inspection microscope:
HSEB Axiospect 300, 300mm Wafer inspection microscope
Stereo Microscope
Tool ID: OPI905
Serial Number: 41302020182


!!! MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE !!!
194902
Irvine Optical Co.  

Irvine Optical Co.  

Ultrastation 3.E 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Plano, Texas
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope:
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
  • For up to 20omm Wafers
  • Nikon CF Optical System
  • 5X, 10X, 20X & 50X Objective Lenses
  • 10X WF Eyepieces
  • 12V 100W Halogen Lamp
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Cold Shutdown
178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
6402
JEOL  

JEOL  

JSM 6100 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Scotia, NY
JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Microscope with LaB Filament
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Singapore,
JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
77955
JEOL  

JEOL  

JWS-7505ZH 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   F* Plano, TX
Jeol JWS-7505ZH:
Critical Dimension Scanning Electron Microscope
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Singapore,
JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
332
Karl Storz  

Karl Storz  

483C 

List all items of this typeParts and Accessories - Other

in Parts and Accessories, Microscope

1 350.00 Scotia, NY
KARL STORZ TWIN FIBER OPTIC LIGHT SOURCE :
Twin Fiber Optic Light Source

Light guide not included.
178326
KLA-Tencor  

KLA-Tencor  

CRS1010 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Singapore,
KLA-Tencor, CRS1010 Defect Review, 200mm:
Manufactured in 1997; Status: Bagged and Skidded
178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* Singapore,
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded


!!! MULTIPLE UNITS AVAILABLE!!! Please inquire
188890
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   East Fishkill, New York
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm
188891
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F* East Fishkill, NY
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm

S/N: 5158014


Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  

178327
KLA-Tencor  

KLA-Tencor  

INS3300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Taichung, Taichung City
KLA-Tencor, INS3300 , Microscopes, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
1127
Leco  

Leco  

VC-50 

List all items of this typeCut-Off Saws

in Sample Preparation

1 2,850.00 F* Scotia, NY
LECO PRECISION DIAMOND CUT OFF SAW 5" BLADE:
Vari/Cut Off Saw

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  F* if the item is specially featured
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