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Scanning Electron Microscopes
JEOL, JWS-7515, 200mm, SEM Offered1 Offered at Best Price

JEOL, JWS-7515, 200mm, SEM



Critical Dimension Scanning Electron Microscopes
Applied Materials, SEMVision CX, 200mm, Offered1 Offered at Best Price

Applied Materials, SEMVision CX, 200mm,



Upright Microscopes
NIKON LARGE SUBSTRATE INSPECTION MICROSOPE Offered1 Offered at Best Price

NIKON LARGE SUBSTRATE INSPECTION MICROSOPE



Upright Microscopes
NIKON UPRIGHT MICROSCOPE BRIGHTFIELD Offered1 Offered at $ 3,575.00

NIKON UPRIGHT MICROSCOPE BRIGHTFIELD



Added  Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
Oct 16 194720
Leica  

Leica  

INS-3300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   N* Taichung, Taichung City
Leica, INS-3300, 300mm, Inspection Microscope:
Leica, INS-3300, 300mm, Inspection Microscope
Aug 11 192695
MASS-PCB  

MASS-PCB  

VHF300 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   N* Malta, New York
MASS-PCB, VHF300, Vacuum Paste Applicator:
MASS-PCB, VHF300, Vacuum Paste Applicator
Jul 31 192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   F*N* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


Jun 21 192026
Leica  

Leica  

S6 E 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 1,950.00 F*N* Scotia, New York
LEICA STEREO MICROSCOPE 6.3X - 40X:
Stereo Microscope with Boom Stand, Dual Light Pipes & .75X Aux lens
Jun 6 191756
FEI  

FEI  

T30 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   F*N* East Fishkill, New York
FEI T30, TEM, with LaB6 filament operating at 300KeV:
FEI T30, TEM, with LaB6 filament operating at 300KeV

Cold idle in Lab.

2010 

S/N: 30TN6S / D906


May 18 191493
Hitachi  

Hitachi  

S-5000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1   N* Burlington, Vermont
Hitachi, S-5000, SEM, 200mm:
Hitachi, S-5000, SEM, 200mm

Running.
Power ON, Under Vacuum.

S/N: 0500-02-03

DOM 1995
Jan 10 189203
Nikon  

Nikon  

XD-20 

List all items of this typeUpright Microscopes

in Optical Microscopes

1   F*N* Scotia, New York
NIKON LARGE SUBSTRATE INSPECTION MICROSOPE:
Brightfield, Darkfield, POL
Reflected and Transmitted Light

N.B. The Kinetic Systems optical table that the Nikon Microscope is on is not included.  However, it is for sale.  More information at Kinetic Systems 1201-04-11

Jan 3 189089
Nikon  

Nikon  

Eclipse LV150  

List all items of this typeUpright Microscopes

in Optical Microscopes

1 3,575.00 F*N* Scotia, New York
NIKON UPRIGHT MICROSCOPE BRIGHTFIELD :
Upright Microscope Reflected Light Brightfield 


*  Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.