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Scanning Electron Microscopes
JEOL, JWS-7515, 200mm, SEM Offered1 Offered at Best Price

JEOL, JWS-7515, 200mm, SEM



Critical Dimension Scanning Electron Microscopes
Applied Materials, SEMVision CX, 200mm, Offered1 Offered at Best Price

Applied Materials, SEMVision CX, 200mm,



Upright Microscopes
NIKON LARGE SUBSTRATE INSPECTION MICROSOPE Offered1 Offered at Best Price

NIKON LARGE SUBSTRATE INSPECTION MICROSOPE



Upright Microscopes
NIKON UPRIGHT MICROSCOPE BRIGHTFIELD Offered1 Offered at $ 3,575.00

NIKON UPRIGHT MICROSCOPE BRIGHTFIELD



Added  Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
Jun 21 192026

Leica  

S6 E 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 1,950.00 F*N* Scotia, New York
LEICA STEREO MICROSCOPE 6.3X - 40X
Stereo Microscope with Boom Stand, Dual Light Pipes & .75X Aux lens
Jun 6 191756

FEI  

T30 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1 N* East Fishkill, New York
FEI T30, TEM, with LaB6 filament operating at 300KeV
FEI T30, TEM, with LaB6 filament operating at 300KeV

Cold idle in Lab.

2010 

S/N: 30TN6S / D906


May 26 191631

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1 N* Burlington, Vermont
Zeiss, Axiotron II, 200mm Inspection Microscope
Zeiss, Axiotron II, 200mm Inspection Microscope

Not working.
Manual XY Stage

S/N: 741567
May 26 191630

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1 N* Burlington, Vermont
Zeiss, Axiotron II, 200mm Inspection Microscope
Zeiss, Axiotron II, 200mm Inspection Microscope

Not working.
Manual XY Stage

S/N: 741472
May 23 191596

Hitachi  

S-4500 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1 F*N* Burlington, Vermont
Hitachi, S-4500, SEM, Failure Analysis SEM
Hitachi, S-4500, SEM, Failure Analysis SEM
Quartz PCI USB V9.5 (for Image Capture)
System is powered up and under vacuum.
Was under service contract through April 2017.


S/N: 7926-02


May 23 191594

FEI  

Tecnial TF-20 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1 F*N* Burlington, Vermont
FEI Tecnai F20 FE-TEM,
FEI Tecnai F20 FE-TEM, 

S/N: D241

Main Instrument:  Tecnai F20 S-Twin 
 
FEI Accessories
 
STEM system for FEG
Tecnai Extended Workstation
HAADF Detector
TIA Software
Scanned Image Technique
EDX Spectroscopy Technique
EFTEM Technique
Tecnai Function with Digital Micrograph
EFTEM EELS Module
Tecnai Macro Facility
Compustage Rotation Holder
Compustage Low Background Double-Tilt Holder
Hingeable Mount, Binoculars
Tecnai Smart Tilt
Tecnai Compucentricity
 
Third-Party Accessories
 
NEC 20-inch LCD Monitor
EDAX Digital Pulse Processor, TEM
Gatan 794 MSC Camera, 1K (BROKEN)
Energy Filter, GIF 2001, Grade A, 1K (BROKEN)
Tecnai K Space Control
EDAX RTEM SUTW Detector
Gatan Single Tilt Rotation Holder, Low Background
Gatan Double Tilt Rotation Holder
 
Also, the Compustage has been upgraded to the newer Tecnai Osiris type.
May 21 191527

KLA-Tencor  

8100XP 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1 F*N* Singapore,
KLA-Tencor, 8100XP, CD SEM, 200mm
KLA-Tencor, 8100XP, CD SEM, 200mm

S/N: 602
May 18 191493

Hitachi  

S-5000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1 F*N* Burlington, Vermont
Hitachi, S-5000, SEM, 200mm
Hitachi, S-5000, SEM, 200mm

Running.
Power ON, Under Vacuum.

S/N: 0500-02-03

DOM 1995
Jan 10 189203

Nikon  

XD-20 

List all items of this typeUpright Microscopes

in Optical Microscopes

1 F*N* Scotia, New York
NIKON LARGE SUBSTRATE INSPECTION MICROSOPE
Brightfield, Darkfield, POL
Reflected and Transmitted Light

N.B. The Kinetic Systems optical table that the Nikon Microscope is on is not included.  However, it is for sale.  More information at Kinetic Systems 1201-04-11

Jan 3 189089

Nikon  

Eclipse LV150  

List all items of this typeUpright Microscopes

in Optical Microscopes

1 3,575.00 F*N* Scotia, New York
NIKON UPRIGHT MICROSCOPE BRIGHTFIELD
Upright Microscope Reflected Light Brightfield 
Aug 28 178710

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1 N* Taichung, Taichung City
Aug 20 178327

KLA-Tencor  

INS3300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1 N* Taichung, Taichung City
KLA-Tencor, INS3300 , Microscopes, 300mm
Manufactured in 2005; Status: Bagged and Skidded
Aug 20 178305

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1 N* Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm
Manufactured in 2007; Status: Bagged and Skidded
Aug 20 178300

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1 N* Taichung, Taichung City
JEOL, Defect Review, 200mm
Status: Cold Shutdown
Aug 20 178298

Hitachi  

RS5000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1 N* Taichung, Taichung City
Hitachi, RS5000, Defect Review, 300mm
Manufactured in 2006; Status: Bagged and Skidded
Aug 20 178297

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Electron Microscopes

1 N* Taichung, Taichung City
Hitachi, RS4000 , Defect Review, 300mm
Manufactured in 2005; Status: Bagged and Skidded


*  Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.