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Scanning Electron Microscopes
JEOL, JWS-7515, 200mm, SEM Offered1 Offered at Best Price

JEOL, JWS-7515, 200mm, SEM



Critical Dimension Scanning Electron Microscopes
Applied Materials, SEMVision CX, 200mm, Offered1 Offered at Best Price

Applied Materials, SEMVision CX, 200mm,



Upright Microscopes
NIKON LARGE SUBSTRATE INSPECTION MICROSOPE Offered1 Offered at Best Price

NIKON LARGE SUBSTRATE INSPECTION MICROSOPE



Added  Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
Apr 17 197918
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Electron Microscopes

1   N* Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:
Hitachi, S-9380II, CD-SEM, 300mm

!!! Multiple Units Available!!!  Please Inquire


*  Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.