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Electron Microscopes


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List all 2 product types under Electron MicroscopesList all 2 product types under Electron Microscopes


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     Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
    Make Model
      $  
    180474

    Applied Materials  

    NanoSEM 3D 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Electron Microscopes

    1 F* East Fishkill, NY
    Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

    MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


    SEM - Critical Dimension (CD) Measurement

    Currently configured for 300mm wafers

    CE Marked

    Install Type: Stand Alone

    Cassette Interface:

    • (3) 300mm FOUP

    Roll-Around Ergo-Station w/Touch-Screen

    Status Lamp

    Options:

    • Slope Reconstruction

    • CH Analysis

    • Profile Grade

    • Discrete Inspection

    • Defect Review

    • ARAMS (ES8)

    Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

     

    Software Options:

    • Slope Reconstruction

    • CH Analysis

    • Profile Grade

    • Discrete Inspection

    • Defect Review

    • ARAMS (ES8

    180514

    Applied Materials  

    NanoSEM 3D 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Electron Microscopes

    1 F* East Fishkill, NY
    Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

    Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

    MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


    SEM - Critical Dimension (CD) Measurement

    Currently configured for 300mm wafers

    CE Marked

    Install Type: Stand Alone

    Cassette Interface:

    • (3) 300mm FOUP

    Roll-Around Ergo-Station w/Touch-Screen

    Status Lamp

    Options:

    • Slope Reconstruction

    • CH Analysis

    • Profile Grade

    • Discrete Inspection

    • Defect Review

    • ARAMS (ES8)

    Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

     

    Software Options:

    • Slope Reconstruction

    • CH Analysis

    • Profile Grade

    • Discrete Inspection

    • Defect Review

    • ARAMS (ES8

     

    Tool ID: KA03

    189511

    Applied Materials  

    Semvision CX 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Electron Microscopes

    1 F* Burlington, Vermont
    Applied Materials, SEMVision CX, 200mm,
    Applied Materials, SEMVision CX, 200mm,

    Serial Number is W854.
    7353

    CPS  

    6004/1958 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 3,750.00 Scotia, NY
    CPS ELECTRON GUN POWER SUPPLY 30KV
    Electron Gun Power Supply

    CPS Computer Power Supply 6004
    100557

    Hitachi  

    S-2400 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 F* Scotia, NY
    HITACHI S-2400 SCANNING ELECTRON MICROSCOPE
    Scanning Electron Micrscope (SEM)
    60831

    Hitachi  

    S-4100 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 F* Scotia, NY
    HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE
    Field Emission Electron Microscope

    NB: System is missing Ion pump power supply. Sold "As Is".
    35762

    Hitachi  

    S-7000 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Electron Microscopes

    1 F* Plano, TX
    Hitachi S-7000
    CD SEM Measurement Tool
    324

    Hitachi  

    S-806C 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 F* Scotia, NY
    HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE
    Field Emission Scanning Electron Microscope
    178293

    Hitachi  

    4500 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 F* Singapore,
    Hitachi, 4500 SEM, 200mm
    Manufactured in 1990
    178296

    Hitachi  

    Microanalysis System 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 F* Taichung, Taichung City
    Hitachi, Metrology, Microanalysis System 300mm
    Status: Bagged and Skidded
    178294

    Hitachi  

    AS5000 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 F* Singapore,
    Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm
    Status: Cold Shutdown

    Wafer Particle & Defect Analysis system AS5000

    Defect data server




    178297

    Hitachi  

    RS4000 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 N* Taichung, Taichung City
    Hitachi, RS4000 , Defect Review, 300mm
    Manufactured in 2005; Status: Bagged and Skidded
    178710

    Hitachi  

    RS4000 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 N* Taichung, Taichung City
    178298

    Hitachi  

    RS5000 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 N* Taichung, Taichung City
    Hitachi, RS5000, Defect Review, 300mm
    Manufactured in 2006; Status: Bagged and Skidded
    191596

    Hitachi  

    S-4500 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 F*N* Burlington, Vermont
    Hitachi, S-4500, SEM, Failure Analysis SEM
    Hitachi, S-4500, SEM, Failure Analysis SEM
    Quartz PCI USB V9.5 (for Image Capture)
    System is powered up and under vacuum.
    Was under service contract through April 2017.


    S/N: 7926-02


    191493

    Hitachi  

    S-5000 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 F*N* Burlington, Vermont
    Hitachi, S-5000, SEM, 200mm
    Hitachi, S-5000, SEM, 200mm

    Running.
    Power ON, Under Vacuum.

    S/N: 0500-02-03

    DOM 1995
    178287

    Hitachi  

    S-7800 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Electron Microscopes

    1 F* Singapore,
    Hitachi, S-7800 CD-SEM, 200mm
    Manufactured in 2008
    178299

    Hitachi  

    Z-5700 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 F* Taichung, Taichung City
    Hitachi, Z-5700 Spectroscopy, 300mm
    Status: Bagged and Skidded
    6402

    JEOL  

    JSM 6100 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 F* Scotia, NY
    JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE
    Scanning Electron Microscope with LaB Filament
    77955

    JEOL  

    JWS-7505ZH 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Electron Microscopes

    1 F* Plano, TX
    Jeol JWS-7505ZH
    Critical Dimension Scanning Electron Microscope
    178300

    JEOL  

    7555 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 N* Taichung, Taichung City
    JEOL, Defect Review, 200mm
    Status: Cold Shutdown
    178302

    JEOL  

    JEM-2500SE 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 Taichung, Taichung City
    JEOL, JEM-2500SE Microscopes, 300mm
    Status: Bagged and Skidded
    178303

    JEOL  

    JEM-2500SE 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 Taichung, Taichung City
    JEOL, JEM-2500SE Microscopes, 300mm
    Status: Bagged and Skidded
    187765

    JEOL  

    JWS 7555S 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 Singapore,
    JEOL, JWS 7555S, Defect Review, 200mm
    JEOL, JWS 7555S, Defect Review, 200mm
    189689

    JEOL  

    JWS-7515 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 F* Singapore,
    JEOL, JWS-7515, 200mm, SEM
    JEOL, JWS-7515, 200mm, SEM

    S/N: WS179028-108
    191527

    KLA-Tencor  

    8100XP 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Electron Microscopes

    1 F*N* Singapore,
    KLA-Tencor, 8100XP, CD SEM, 200mm
    KLA-Tencor, 8100XP, CD SEM, 200mm

    S/N: 602
    178304

    KLA-Tencor  

    ES31 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 F* Singapore,
    178305

    KLA-Tencor  

    ES32 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 N* Taichung, Taichung City
    KLA-Tencor, ES32, E-beam Inspection, 300mm
    Manufactured in 2007; Status: Bagged and Skidded
    188890

    KLA-Tencor  

    eS810 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 East Fishkill, New York
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    188891

    KLA-Tencor  

    eS810 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 F* East Fishkill, NY
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    KLA-TENCOR, eS810, e-beam inspection, 300mm

    S/N: 5158014


    Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  

    81042

    Microspec  

    WDX-2A(Spectrometer) 

    List all items of this typeScanning Electron Microscopes

    in Electron Microscopes

    1 Scotia, NY
    MICROSPEC WDX-2A SPECTROMETER
    Spectrometer


    *   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

    NOTE:
       photo available
       reference document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.

    Items from the following manufacturers are offered under Electron Microscopes:
    Applied Materials, Inc., CPS, Hitachi, JEOL, KLA-Tencor, Microspec