ALL CATEGORIES   Electron Microscopes    View    Search-by-Specs    Input    Edit    
View All Listings Under

Critical Dimension Scanning Electron Microscopes


» Switch Major Category
Click an item's ID# below for its full specifications and source, or:

List other sub-categories under Electron MicroscopesList other sub-categories under Electron Microscopes

Show other product types under Electron MicroscopesShow other product types under Electron Microscopes

  • To sort on a column, click the column head; click it again to reverse the sort.  View measures in specified units, or  click to change units of measureMetric  click to change units of measureUS
  • Click Compare Items to compare the full details of up to 5 items.
  • Offered (box) or Wanted (coins)Item IDItem DescriptionSize RangeResolution ÅCD Measure RangeCass to CassTilt Stage#PriceNote Location
    MakeModelSet SizeMinMax
    (Å)(µm)(µm)$
    Wanted88077Hitachi 4700nono1 F*Scotia, NY
    Offer113771Hitachi S-4500nono1Click for Picture Austin, TX
    Offer89744Hitachi S-4700100 mm12.001.502.50YESYES1Click for Picture F*Austin, TX
    Offer85796Hitachi S-6000150 mmnono110,000.00Click for Picture F*Dallas, TX
    Offer94170Hitachi S-628OH150 mmnono140,000.00Click for Picture F*Dallas, TX
    Offer35762Hitachi S-7000150 mm150.000.10200.00YESYES1Click for Picture Plano, TX
    Offer118934Hitachi S-7000150 mm150.000.10200.00YESYES1Click for Picture Austin, TX
    Offer44179Hitachi S-7800/S-8820YESYES1Click for Picture Austin, TX
    Offer107547Hitachi S-8840150 mm50.00YESno1375,000.00Click for Picture F*Regensburg, BY
    Offer107548Hitachi S8C40200 mmYESno1375,000.00Click for Picture F*Regensburg, BY
    Offer91861JEOL JWS 300030.00YESYES1Click for Picture F*Scotia, NY
    Offer77955JEOL JWS-7505ZH80.00YESno1Click for Picture Plano, TX
    Offer76095JEOL JWS-7505ZH200 mmYESno1Click for Picture Austin, TX
    Offer71139Tamar Technologies CD Measure150 mmnono1Click for Picture F*Austin, TX


    NOTE:
       when photo available
       when document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.

    Items from the following manufacturers are offered under Critical Dimension Scanning Electron Microscopes:
    Hitachi, JEOL, Tamar Technologies