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FULL DESCRIPTION of Item 71139 in

Critical Dimension Scanning Electron Microscopes

Deal directly with:  AECI Texas Surplus Sales of Austin, TX
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TAMAR TECHNOLOGY

Critical Dimension Measurement System


Tamar Technology Semi-Automated Critical Dimension Measurement System.
TAMAR TECHNOLOGY
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Location: (Austin, TX )
Unit Price Unstated
Number of Units 1
ManufacturerTamar Technologies
ModelCD Measure
Wafer Size Range
  Set Size150 mm
Acceleration Voltage
  Maximum Voltage4 kV
Year of Manufacture2006
ConditionLike New

Source: (click name below to visit its website directly)

  AECI Texas Surplus Sales of Austin, TX

Shipping & Handling:

Equipment will be sold FOB origin.

We are not responsible for any damage incurred during shipment. It is the buyer's responsibility to inspect packages for damage and to note damage on bills of lading. Any Questions please call (512) 385-6200.

Payment:

100% payment in full required prior to shipping



Deal directly with:  AECI Texas Surplus Sales of Austin, TX
  COUNTER OFFER
for this item  
  INQUIRE about this item