ALL CATEGORIES   Electron Microscopes

View    Search-by-Specs    Input    Edit

FULL DESCRIPTION of Item 71139 in Critical Dimension Scanning Electron Microscopes

Deal directly with:  AECI Texas Surplus Sales of Austin, TX   COUNTER OFFER for this item     INQUIRE about this item

1 Offered at Best Price TAMAR TECHNOLOGY Critical Dimension Measurement System Tamar Technology Semi-Automated Critical Dimension Measurement System.   ... other image
Location: (Austin, TX )
Unit Price	Unstated
Number of Units	1
Manufacturer	Tamar Technologies
Model	CD Measure
Wafer Size Range
Set Size	150 mm
Acceleration Voltage
Maximum Voltage	4 kV
Year of Manufacture	2006
Condition	Like New

Source: (click name below to visit its website directly)

  AECI Texas Surplus Sales of Austin, TX

Shipping & Handling:

Equipment will be sold FOB origin.

We are not responsible for any damage incurred during shipment. It is the buyer's responsibility to inspect packages for damage and to note damage on bills of lading. Any Questions please call (512) 385-6200.

Payment:

100% payment in full required prior to shipping



Deal directly with:  AECI Texas Surplus Sales of Austin, TX

COUNTER OFFER for this item     INQUIRE about this item